ASTRO’S Annual Meeting is the premier radiation oncology scientific event in the world and draws more than 11,000 attendees each year.During the 2015 Annual Meeting, we will highlight recent technological advances while emphasizing the importance of the clinical and non-clinical skills needed to provide patients with the full benefit of radiation oncology. The scientific program will continue to be the ideal platform to bring together clinicians, scientists and researchers from all oncology disciplines to exchange ideas, promote multidisciplinary care and address the educational and professional development interests of our attendees.Scientific and educational sessions will cover specific clinical areas including breast, central nervous system, gastrointestinal, genitourinary, gynecologic, head and neck, lymphoma, musculoskeletal, pediatric, sarcoma and thoracic cancers. Radiation biology and radiation physics concepts will be explored in their own tracks.The Annual Meeting will feature a continued emphasis on patient quality and safety issues in the delivery of radiation therapy in the areas of treatment techniques, equipment, terminology and professional responsibilities. Program content has been designed to address specific documented and clinically important practice gaps in physician knowledge, competence and performance.
ASTRO is an accredited provider of continuing medical education and adheres to the policies and standards set forth by the Accreditation Council for Continuing Medical Education (ACCME). As such, abstract authors are required to disclose relationships with commercial interests. A commercial interest is defined as "any entity developing, producing, marketing, re-selling or distributing health care goods or services consumed by or used on patients".To ensure its compliance, ASTRO expects that the content and related materials will promote improvements or quality in health care and not a specific proprietary business interest or commercial bias. We employ several strategies to ensure absence of bias: